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EIA-364-25E:2017
New product
EIA-364-25E:2017
TP-25E Probe Damage Test Procedure for Electrical ConnectorsMore info
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 29.120.20 : Connecting devices
|
| Number of pages | 13 |
| Replace | EIA-364-25D (2010-11) |
| Cross references | ANSI/EIA-364-25E (2017), IDT |
| Year | 2017 |
| Document history | EIA-364-25E (2017-03) |
| Country | USA |
| Keyword | EIA 364;EIA 364.25E;EIA-364;364 |