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EIA-364-32G:2014
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EIA-364-32G:2014
TP-32G Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and SocketsMore info
This test is conducted for the purpose of determining the resistance of a given electrical connector or socket to exposure at extremes of high and low temperatures and to the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. NOTE - This procedure includes the provision for testing at cryogenic temperatures. Cryogenic temperatures should only be used with specimens specifically designed to be compatible with such temperatures.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 29.120.20 : Connecting devices
|
| Number of pages | 20 |
| Replace | EIA-364-32E (2008-05) |
| Cross references | ANSI/EIA-364-32F (2011), IDT |
| Year | 2014 |
| Document history | EIA-364-32F (2011-06) |
| Country | USA |
| Keyword | EIA 364;EIA 364.32F;EIA-364;364 |