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VITA 51.3:2010 (R2016)
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VITA 51.3:2010 (R2016)
Qualification and Environmental Stress Screening in Support of Reliability PredictionsMore info
This standard provides rules, permissions, and observations to assure that cost-effective qualification and environmental stress screening support valid reliability predictions and enhance electronics reliability. It includes a discussion of the systems engineering relationships between qualification, environmental stress screening, and reliability.
| Author | ANSI/VITA |
|---|---|
| Editor | VITA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2016-08-24 |
| ICS | 31.020 : Electronic components in general
|
| Year | 2010 |
| Document history | |
| Country | USA |
| Keyword | ANSI 51;ANSI/VITA 51;51;ANSI/VITA 51.3-2010 (R2016) |