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ESD STM5.5.1:2016
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ESD STM5.5.1:2016
ESD Association Standard Test Method for Electrostatic Discharge (ESD) Sensitivity Testing - Transmission Line Pulse (TLP) - Device LevelMore info
The scope and focus of this document pertains to TLP testing techniques of semiconductor components. The focus of the document is on quasi-static application of TLP testing techniques, however the techniques can also be applied to study transient behavior of semiconductor components.
| Author | ESD |
|---|---|
| Editor | ESD |
| Document type | Standard |
| Format | File |
| Confirmation date | 2017-01-05 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Replace | ANSI/ESD SP 5.5.2 (2007) |
| Year | 2016 |
| Document history | ANSI/ESD STM 5.5.1 (2017) |
| Country | USA |
| Keyword | ANSI 5;ANSI/ESD STM 5;ANSI/ESD 5;5;ANSI/ESD STM5.5.1-2017 |