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ATIS 0600010.03 2011 Edition, July 2011 Heat Dissipation Requirements...
EIA RS-155-B:1970 Fixed Wirewound Power Resistors
EIA JEP 79:1969 Life Test Methods for Photoconductive Cells
EIA-362:1969 Tensile Properties of Magnetic Tape, Recm. Test Method R(1974)
EIA CB-5:1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
EIA JEP 78:1969 Relative Spectral Response Curves for Semiconductor Infrared Detectors
EIA-365:1969 Performance Test Procedure for Solar Cells and Calibration Procedure for Solar Cell Standards for Space Vehicle Service
EIA-369:1969 Midget I.F. Shields (.75 inch Square) (Reaffirmation of REC-144) R(1982)
EIA JEB 15:1969 Terminology and Methods of Measurement for Bistable Semiconductor Microcircuits
EIA JESD 353:1968 (R2009) The Measurement of Transistor Noise Figure at Frequencies up to 20 kHz by Sinusoidal Signal-Generator Method
EIA-356:1968 Definitions and Terminology in Connection with Record Changers and Manual Phonographs R(1973)
EIA RS-348:1968 Magnetic Field Polarity, Including Definitions and Determination of Polarity
EIA JESD 354:1968 (R2009) The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz